Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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AC Test Transformer
Yangzhou Power Electric Co., Ltd
The AC test transformer are especially designed for testing high voltage products and components, such as cables, power transformers, gas-insulated switchgears, bushings and arresters. It is also suitable to test insulation materials. They are used to generate testing high voltage and function as part of the complete system. These systems are particularly suited for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (inductive voltage transformers).
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6-24V Car Circuit Tester
1952
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable for earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
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MCB Thermal Trip Calibration Test Bench (IEC 60898 Cl 9.10.1.2, Annex I.1, IS)
The test system is designed and customized to carry out 2.55*Intest as per Table 7 (test c) of IEC 60898 (also mentioned for routine testing of MCBs. The test is done at dc current to exactly analyze and correct the bimetallic properties of the MCB as far as thermal tripping is concerned. The unit comes with a pneumatically operated test fixture with in-built dc stepper motor that is controlled by a micro controller / PC to calibrate the breaker into a narrow tripping band programmed by the user.
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Infiniium S-Series High-Definition Oscilloscope: 8 GHz, 4 Analog Channels
DSOS804A
8 GHz bandwidth4 analog channels Capture a longer signal trace with 20 GSa/s max sample rate and 100 Mpts/channel of standard memory Get superior signal integrity with system ENOB of 6.4 bits and 10-bit analog-to-digital converter (ADC)Gain increased usability with the multi-touch supported 15 inch capacitive touch screen and solid state drive for fast boot and reliability Improve your testing with a wide range of protocol, compliance, and analysis software
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Battery String Simulator
BSS
AMETEK Programmable Power, Inc.
The Elgar Battery String Simulators (BSS) provide safe, reliable battery power for spacecraft testing. The broad range of features available ensures simulation capabilities for more than just two terminal power. It's the ideal solution for complete integrated system testing, not just battery elimination.
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Data Acquisition Systems
LMS SCADAS
Siemens Digital Industries Software
The LMS SCADAS state-of-the-art data acquisition systems cover all types of noise, vibration, durability testing and engineering tasks in the lab, in the field, with a PC or through autonomous recording. Seamless integration with LMS Test.Lab and LMS Test.Xpress provides you with reliable results and optimal testing productivity. Take your mind off the deadline and focus on the test. From lab to mobile to portable.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditio...show more -
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 925Ω
40-252-121
The 40-252-121 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 3.55kΩ
50-297-123
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Fiber Optic Power Meters and Fault Locators
Fiber optic communication systems require the right tools to commission new links and to troubleshoot existing links. Fluke Networks has a wide range of Fiber Optic testing products to help certify that power losses are within standards and to troubleshoot broken and high loss links on single mode and multimode fiber. Fluke Network fiber optic tools are designed to be rugged and reliable, and to get the job done.
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Dual Bay Flex 40 For Larger Generic Test Systems
Flex 40
The Flex 40 is generally suited to the larger Generic Test Systems. A Flex 40 is a dual bay version of the Flex 30 that gives us the ability to fit a wide range of external instrumentation, PXI, custom modules and large fixture interfaces. Generally it is fitted with the VPC G12x Interface but this can be changed to suit the requirement.
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Multiport Electromechanical Coaxial Switch, DC to 40 GHz, SP4T
87104D
The Keysight 87104D multiport switch improves signal accuracy in RF and microwave signal routing and testing applications. This high performance electromechanical switch provides unmatched isolation and a 0.03 dB insertion loss repeatability, which is warranted for the 5-million life cycle of the switch. The 87104D’s low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy. The repeatability and reliability of this switch guar...show more -
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Temperature Chamber
MTC-20
Improve your temperature dependent testing with the Compact Bench Top Temperature Chamber, seamlessly integrated with a Maccor Automated Test System. Its compact design allows for easy placement on any benchtop. For increased capacity, you can install up to 4 chambers into a standard 19” industrial rack cabinet.
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Dual HD Test Signal Generator with Embedded Audio
7751TG2-HD
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
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Common Metallic Pendulum Impact Testing Machine
JB-(C/D)
Jinan Testing Equipment IE Corporation
KB- (C/D) common type metallic pendulum impact testing system is the basic model for impact tester. The metallic pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and capable of doing a large number of impact tests continuously. The display method for the models is different, respectively there are analog dial display, touch screen digital display and computer display. For the later two models, it can display the impact power, impact toughnes...show more -
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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Residual Quality Control
Hill Engineering's expertise in residual stress and material performance provides us with a unique opportunity to effectively design and manage production quality programs. For example, a quality system for residual stress in aluminum forgings would provide the means to control, monitor, and certify the residual stress. In general, the quality system seeks to identify key metrics in the manufacturing process, establish a testing protocol for these metrics to qualify the manufacturing process, an...show more -
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Voltage Transformer Testing System
KVTS
The Knopp Voltage Transformer Testing System is designed to measure the accuracy of instrument transformers having 120 volt secondaries and up to 14,400 volt primaries (special order for up to 36,000 volt primaries is available). The system includes a control console which contains the control circuitry, ANSI standard burdens, and the Knopp Automatic Transformer Comparator. The Knopp precision and loading transformer set is also included (as pictured) and is connected to the console via a special cable.
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Configurable Data-Logging System
NI CompactDAQ
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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RFIC ATE System
RI 7100A
The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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HIL Breakout Board
Onboard 192 pin snap-in terminal dramatically simplifies the wiring between your control hardware and your HIL system. As soon as the system is up and running there are 192 test terminals for easy access to all the interface signals: firing pulses, control feedback signals and other analog/digital I/O signals.
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Adjustable Test Stab Set
The ETI adjustable test stab set may be used with your high-current circuit breaker testers to maximize efficiency and convenience for testing multiple breakers. Our stab system allows your technicians to test breakers in-place and avoid jacking breakers up or down for testing. By combining mobility and flexibility into one simple system, this stab set is a proven improvement over conventional designs. The components in the adjustable stab set are made of 120 pounds of 110 copper.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system...show more -
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Contact Resistance Measurement System
CRMS
The CRMS is a system designed to allow any user to measure the resistance of each set of relay contacts associated with the relay under test. The test system consists of a CONTACT RESISTANCE MEASUREMENT UNIT (CRMU), a MULTIPLE RELAY TEST RACK, as well as an interconnect CABLE ASSEMBLY. Either DC or AC energy to pick and drop relay coils under test for all contact measurements is supplied from the CRMU and easily interfaces with the Multiple Relay Test Rack. For additional and more thorough testi...show more -
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Advanced Power System - DC Power Supply, 60 V, 16.7 A, 1000 W
N6953A
When designing high performance ATE systems, there`s an art to the tradeoffs you make when asked to "integrate fast and test faster within budget." That's why Keysight's N6900 Series DC power supplies are small, flexible and market-leading fast. And with our VersaPower architecture, you can tune the N6900 for the optimum balance of test coverage, quality and time.
